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The compilation for the temperature cycling testing and temperature change rate of automotive electronics
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The compilation for the temperature cycling testing and temperature change rate of automotive electronics

The compilation for the temperature cycling testing and temperature change rate of automotive electronics

The compilation for the temperature cycling testing and temperature change rate of automotive electronics

Electric vehicles bring the automotive technologies and the electrical, electronics, semiconductor technologies together, King Son test chambers are designed oriented from ICT products and semiconductors environmental requirements tests, ready complying with ISO, IEC, AEC-Q100, AEC-Q200 and LV 124 PART II testing standards capable to test electric vehicle’s automotive electrical, electronic and semiconductor parts and components such as Battery cells, Battery modules, Battery pack, Battery systems (all-electric auxiliary), Charge port, DC/DC converter, Electric traction motor, Onboard charger, Power electronics controller, Thermal system (cooling), Traction battery pack, Transmission (electric).
 
King Son is ready now and starts to deliver the outstanding King Son test chambers and solutions for electric vehicles and automotive electronics industry to conduct reliability testing with efficiency performance.
 
According to the latest electric vehicle testing regulations and international testing standards, the testing requirements for surface temperature detection and temperature cycle temperature change rate of testing specimens have become a prominent reliability testing technology trend.
 
King Son's environmental testing chambers that meet the requirements of international testing standards is designed in with surface temperature detection and temperature cycle temperature change rate by testing specimens to conduct product's liability testing.
 
King Son 's Advanced Series THS, TSC, ATSK, HAST+ testing chambers leads the industry with superior technology.
 

The latest new testing requirements for the dwell time of testing specimens is when the internal temperature of DUT, Devices Under Test, reaches the set temperature and stabilizes that.

Temperature cycle temperature change rate and temperature thermal shock

Temperature cycle testing standards and temperature change control is based on the surface temperature of the specimens (DUT, Device Under Test) JEDEC-22A-104F、IEC60749-25、IPC9701、ISO16750、AEC-Q100、LV124、GMW3172Temperature cycle temperature change rate and temperature thermal shock







Conduct the temperature cycle test by the feature of surface temperature control of the specimens.



Conduct the temperature cycle test by the feature of surface temperature control of the specimens.


1. Heating and cooling temperature can be controlled by the air temperature above the specimens or the surface temperature of specimens (DUT,Device Under Test).

2. Dual modes, available to select the heating and cooling temperature change rate.

3. The temperature change rate can be setup by choosing either Total temperature change time or Temperature change rate per minute to set the heating and cooling rate for the testing specimens.

*Total temperature change time (minute) complying with international testing standards JESD22-A104F、MIL-STD-883K、CR200315、ED-4702A.

*Temperature change rate per minute (℃/minute) complying with international testing standards IEC 60749、IPC-9701、Bellcore-GR-468、MIL-2164.


4. The reciprocal of the dwell time can be determined by the surface temperature of the specimens.

5. The number of channels used to control the surface temperature of the specimen: 8 channels.