Temperature cycle testing standards and temperature change control is based on the surface temperature of the specimens (DUT, Device Under Test) JEDEC-22A-104F、IEC60749-25、IPC9701、ISO16750、AEC-Q100、LV124、GMW3172
2. Dual modes, available to select the heating and cooling temperature change rate.
3. The temperature change rate can be setup by choosing either Total temperature change time or Temperature change rate per minute to set the heating and cooling rate for the testing specimens.
*Total temperature change time (minute) complying with international testing standards JESD22-A104F、MIL-STD-883K、CR200315、ED-4702A.
*Temperature change rate per minute (℃/minute) complying with international testing standards IEC 60749、IPC-9701、Bellcore-GR-468、MIL-2164.
4. The reciprocal of the dwell time can be determined by the surface temperature of the specimens.
5. The number of channels used to control the surface temperature of the specimen: 8 channels.
150℃(30min)←→-55℃(30min)、Ramp:15℃/min
7.5 Kg(Fixture:3.04 kg+PCB:4.46 kg)
5.0 Kg(Fixture:3.04 kg+PCB:1.96 kg)
2.5 Kg(Fixture:1.52 kg+PCB:0.98 kg)